Miller D.J., Maroni V.A., Li X., Zhang W., Kodenkandath T., Chen Z., Holesinger T.G., Larbalestier D.C., Feenstra R., Coulter J.Y., Civale L., Maiorov B., Feldmann D.M., Huang Y.
Ключевые слова: HTS, YBCO, coated conductors, nanoscaled effects, microstructure, chemical solution deposition, fabrication, nucleation, porosity, critical current, n-value, homogeneity, thickness dependence, pinning force, MOD process, critical current density, angular dependence, RABITS process, PLD process, Jc/B curves, critical caracteristics
Ключевые слова: HTS, YBCO, films thick, nanodoping, Jc/B curves, pinning force, substrate SrTiO3, PLD process, thickness dependence, microstructure, critical caracteristics, fabrication
Chen Z., Larbalestier D.C., Selvamanickam V., Xie Y.Y., Kim S.I., Reeves J.L., Feldmann D.M., Gurevich A., Song X.
Ключевые слова: HTS, YBCO, nanodoping, coated conductors, MOCVD process, Jc/B curves, angular dependence, irreversibility fields, pinning force, microstructure, critical current, critical current density, thickness dependence, magnetic field dependence, critical caracteristics, fabrication, magnetic properties
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Jia Q.X., Verebelyi D.T., Chen Z., Holesinger T.G., Larbalestier D.C., Civale L., Maroni V., Maroni V., Huang Y., Rane M.V., Rane M.V., Feldman D.M.
Zhou Y.-L., Chen Z.-H., Lu H.-B., Yang G.-Z., Liu Z., Jin K.-J., Cheng B.-L., Wang S.-F.(wsf@aphy.iphy.ac.cn), Zhao S.-Q.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, substrate Ni, buffer layers, seed layers, PLD process, fabrication
Ключевые слова: MgB2, nanodoping, bulk, films, Jc/B curves, critical caracteristics
Ключевые слова: HTS, coated conductors, substrate LaAlO3, buffer layers, TFA-MOD process, fabrication
Li C.S., Yan G., Feng Y., Sulpice A., Mossang E., Xu Z., Xu H.L.(xhlxhl@zzu.edu.cn), Wu Y.F., Chen Z.L.
Ключевые слова: HTS, wires, PIT process, sintering, temperature dependence, Jc/B curves, fabrication, critical caracteristics
Ключевые слова: MgB2, bulk, fabrication, resistivity, temperature dependence, Jc/B curves, experimental results, critical caracteristics
Yang J., Chen Z., Jiang X.(xhjiang@mail.eea.tsinghua.edu.cn), Chu X., Jin N., Cheng Z., Ren X., Gou L.
Ключевые слова: SMES, HTS, Bi2223, tapes, coils solenoidal, critical current, dielectric properties, power equipment, critical caracteristics
Ключевые слова: FCL resistive, transformers, circuit breaker, modeling, power equipment, magnetic properties, resistor
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